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F50 - Thin film measurement

F50 - Thin film measurement


Thin-film thickness and n&k are mapped quickly and easily with the F50 advanced spectral reflectance system. The motorized R-0 stage moves automatically to selected measurement points and provides thickness measurements in seconds. Choose one of the dozen+s of predefined polar, rectangular, or linear map patterns, or create your own with no limit on the number of measurement points. The entire desktop system is set up in minutes and can be used by anyone with basic computer skills.

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