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Nanonics - MultiView 1000 - SNOM / AFM / Confocal Imaging

Nanonics - MultiView 1000


The award winning MultiView 1000™ is the first system available that fully integrates all forms of scanned probe microscopy with conventional optical microscopy. Designed around Nanonics' patented, award winning 3D Flatscan™ scanner technology and incorporating sophisticated cantilevered optical fiber probes, the instrument can simply and transparently be combined with any inverted, upright, or dual optical microscope.

Overall, the MultiView 1000™ is a robust and versatile SPM system which allows the user to zoom, with overlapping fields of view, from the lowest resolutions of conventional far-field imaging to the higher resolutions of confocal microscopy, and finally, to the ultimate resolutions of AFM and NSOM.

Main features:


Normal Force Sensing

With cantilevered optical fiber probes, the MultiView 1000™ system does away with much of the complexity associated with near-field imaging. Awkward shear-force techniques are a thing of the past as the normal-force sensing capability of the probe makes tip approach identical to that used in ordinary atomic force microscopy.


Large Z Scan Range

The large, 70-micron x, y and z-range of the Nanonics 3D Flatscan. makes it ideal for optical sectioning in confocal imaging. Used in this way, the MultiView 1000™ integrates conventional far-field imaging, confocal microscopy, AFM, and near-field optics in a single system.


Open System Architecture - Reflection, Transmission, and collection imaging

yeast_cellsThe unique geometry of the Nanonics NSOM head and cantilevered probes leaves the optical axis free both above and below the sample, allowing the user to view the tip position during scanning and to perform NSOM imaging in reflection, transmission, and collection modes.


Integration with Complementary Techniques

The open system architecture also enables the MultiView 1000™ to be integrated with other instruments:


Electrical and Thermal Measurements

The flexibility of the MultiView 1000™ also makes it compatible with numerous types of specialized SPM and NSOM probes. For example, Nanonics designs wired probes that are capable of performing simultaneous AFM and thermal measurements, NSOM/electrical/topographic measurements, or AFM and electrical measurements, such as spreading resistance and capacitance.


Complete NSOM/AFM/Confocal Systems

Nanonics provides a complete NSOM/SPM microscopy system, including a host microscope with confocal detection, a control system, an illumination/detection system, and the widest variety of additional system accessories available on the market


Modular & Customized Systems

Its system architecture also enables the MultiView 400™ to be integrated with commercial micro-Raman microscopes, such as those developed by Renishaw plc. Such combined system integration permits correlation of SPM topographic, thermal and electrical properties of a sample surface with micro-Raman spectra. If placed into the sample chamber of any SEM microscope, the MultiView 400™ can allow simultaneous SEM and AFM imaging of a sample.


Available options for the MultiView 1000™