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AFM probes AppNano

AFM Probes

 

 

AppNano Probes are compatible with most commercially avaible SPMs. These probes are nano-fabricated using highly doped single crystal silicon with unparalleled reproductibility, robustness and sharpness for consistent high resolution imaging capabilities.

Many models are available. Standard Contact / Tapping Mode probe, Standard Electric Force mode probe, Force Modulation Standard probe mode, Standard Mode Non-Contact/Tapping probes.

For more information about this page contact ScienTec : afm.probes@scientec.fr


Probes guide

ACCESS-C™ Series - Contact/ Non-Contact

Appnano access probes are used in contact and non-contact and allow a direct optical view. They compensate the deflection angle for dimensional measurements.
These probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging.g...

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FORT & ACT Series - Non-contact

FORT probes are medium frequency silicon probes designed for tapping / non-contact mode applications. These probes have a medium spring constant that make them ideally suited for Force Modulation Microscopy.

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ACT probes are silicon probes designed for tapping / non-contact mode applications. These probes feature a short cantilever.

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MAGT Series - MFM

MAGT probes are silicon probes specially designed for Magnetic Force Microscopy (MFM) applications. Both reflex and tip sides have a layer of magnetic coating. Our MAGT probes vary in coercitivity and moment to match different MFM requirements....

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ANSCM Series - EFM/ KFM/ CAFM/ ResiScope

ANSCM probes are silicon probes with a thin layer of Pt/Ir coating on both reflex and tip sides of the probes. These probes are ideal for Electrical Force Microscopy (EFM) and Kelvin Force Microscopy (KFM) applications, and are available for use in CAFM mode.
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HYDRA-All Series - Contact

HYDRA-ALL Series probes are designed primarily for imaging soft samples in contact or for force-distance applications, but can also be used for imaging samples in non-contact / tapping mode in liquid. Hydra-All probes have 4 V-shaped cantilevers on one chip with differents spring constant....

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Doped Diamond Series - CAFM/ ResiScope

AppNano Doped Diamond Probes offer a unique combination of hardness and conducting tip. They are specially designed for electrical measurements based on contact mode. The tip side of these probes is coated with polycrystalline diamond. The diamond film is in-situ doped with boron to make it highly conducting. The reflex side of the cantilever is coated with Aluminum. These probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility and robustness. ...

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