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Products


Surface Analysis
 

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Scanning Probe Microscopy


CSInstruments

- Nano-Observer AFM

- ResiScope current and resistance measurements

 

Anasys Instruments

-NanoIR2 (AFM + IR)

-NanoIR2-s (-AFM-IR + SNOM)

 

Nanonics

-Microscopy SNOM

 

Accessoires

- AFM Probes




Vacuum Technology

 

Prevac

- Ultra High Vacuum systems

- Manipulators, goniometer...

- Sample holders

- Instruments

- Accessories


- Electronics

- Software

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2D/3D optical profilometry

 

KLA Tencor

- Interferometer

 

Toho Technology

- Stress measurement


Alicona

- Roughness and form

Lyncee Tec

- 3D dynamic holography


- Reflectometer


- Memstool

 

 

 

 

 

 

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Nano-Indentation

 

Nanomechanics

- Indenter In-Situ

 

- Nano-Indenter


- Nano-Indenter (ambient & vacuum)

 



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Thin film

 

Filmetrics

- Spectrale measurement

- Measurement of thickness

- Optical constant

 



Mechanical Profilometry

 

KLA Tencor

- Profilometer

Toho Technology

- Profilometer large sample