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Vous êtes ici : Accueil > Surface Analysis

Surface Analysis Instruments

ScienTec Ibérica offers surface analysis equipment to visualize and measure various properties. They relate to the surface condition, mechanical, chemical, electrical, optical, stress properties, thickness or even roughness under different environments; under vacuum, ambient or under controlled atmosphere ... The analyzes cover a large magnification ranging from the atomic scale to a few millimeters.

 

Atomic Force Microscopes

microscopes-force-atomique

CSInstruments, manufacturer of AFM microscope, offers many solutions:

  • Atomic Force Microscopes >
  • AFM Probes >
  • AFM IR >

Optical profilometry

Profilometre-optique

Digital holography, confocal, interferometer. KLA, LyncéeTec and Filmetrics systems...

 

  • Optical profilometers >
  • Dynamic measurement >

Mechanical profilometry

profilometre-mecanique-kla

KLA Tencor and Toho Technology offer a wide range of products allowing profile measurements with contact by scanning a stylus

 

  • Mechanical profilometers >

IR & RAMAN
Spectroscopy

spectroscopie-ir

Photothermal Spectroscopy Corp pioneer of submicron infrared spectroscopy and S&I specialist in RAMAN solution

  • Infrared + RAMAN >
  • RAMAN >
  • AFM IR >

Thin Film Measurement

couches-minces

Filmetrics / KLA offers solutions in single / multiple measurements, online, adapted on microscope or in situ. From nm to mm of measurable thickness ...Du nm au mm d’épaisseur mesurable...

  • Reflectometers and thickness measurement >

Nano
Indentation

nanoindenteur

KLA offers a wide range of Nanoindenters for the vacuum or ambient system, including the in-situ model ...

  • Nanoindenters
  • Environnements
  • Universal Test Machine

More Information >

 

Vacuum
Systems

systeme-sous-vide

Prevac offers a wide range of vacuum and ultra vacuum equipment.

  • Deposit systems (MBE, PLD, CVS) >
  • Analysis systems (XPS, UPS, ARPES) >
  • Accessories and
    instruments >

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