Atomic Force Microscopes (AFM)
CSInstruments, manufacturer specializing in the design of atomic force microscopes, offers many solutions in AFM, such as Nano-Observer, the best performance / price AFM and, recently, the best set of AFM electrical measurements with the sMIM (Scanning Microwave Impedance Microscopy) system associated with the ResiScope II ( capable system measure resistance over 10 decades) and HD-KFM (one pass KFM optimized with higher sensitivity and resolution).
In addition to this electrical measurement pack, CSInstruments also offers you different modes of environment such as temperature, liquid measurements or environmental control and AFM accessories (AFM tips ... ).
The Nano-Observer is a compact and powerful AFM microscope with an all-in-one scanner (large and high resolution scans in a single scanner). In addition to the standard modes, you can have advanced modes and unique features such as HD-KFM, ResiScope, MLFM…
1. HD-KFM : High Definition Kelvin Force Microscopy
2. ResiScope II : Current / Resistance over 10 decades
3. Soft ResiScope : ResiScope on delicate samples
5. sMIM : Permittivity and conductivity mapping at nm
1. Environmental control: Gas, humidity
2. Liquid medium: No additional adjustment
3.Temperature control: From -35 ° C to 250 ° C
Wide range of AFM probes
- No Contact
- EFM / MFM
- High resolution