• Skip to primary navigation
  • Skip to content

00 34 91 842 94 67

MENUMENU
  • English
    • Français
Logo-sti
  • Surface Analysis
    • Atomic Force Microscopes
      • Nano-Observer
      • Advanced electrical modes
      • Environments
      • AFM Probes
      • AFM IR
    • Optical profilometers
      • Optical profilometers
      • Dynamic measurements
    • Mechanical profilometers
    • Thin Films
      • Reflectometers and thickness measurement
      • Resistivity & conductivity mapping
    • NanoIndenters
    • Vacuum systems
      • Deposit systems
      • Analysis systems
      • UHV accessories and instruments
    • IR and Raman spectroscopy
      • AFM IR
      • Infrared
      • RAMAN
    • Plasma Cleaners
  • Services
  • Trainings
  • After Sales Service
  • Company
    • ScienTec Ibérica
    • Event
    • News
  • Contact

Vous êtes ici : Accueil > Produits > Optical Photothermal Infrared spectroscopy

Optical Photothermal Infrared spectroscopy

O-PTIR

1. Submicron infrared spatial resolution
2. Non-contact measurement
3. Technique not requiring sample preparation
4. Convenience of a contactless reflection technique
5. Quality of the FTIR transmission spectra.

Optir

IR spectroscopy

Spectroscopy-ir-mirage

mIRage : Submicron InfraRed Spectroscopy >

 

Ir-raman-spectroscopie

IRaman : At the same time in the same place with the same resolution >

Icon_Scientec-03

Need Help ?

Contact us >>

 

The Solution

O-PTIR uses a collinear visible light source to detect IR absorption, which results in non-contact measurement, thus requiring little or no sample preparation before analysis. Since the light "probe" is used to detect the thermal expansion of the sample, the spatial resolution is independent of infrared light and the submicron infrared spatial resolution is reached.

 

Optir-spectroscopy

Spectra on thick samples correlated to FTIR transmission

O-PTIR offers the best of both worlds, combining the convenience of a contactless reflection mode technique with the quality of FTIR transmission spectra.

Below: Three different O-PTIR spectra collected on 20 µm thick samples (below) were searched in the KnowItAll® database with high matches for polystyrene (PS) (left), polyethylene terephthalate (PET) (medium) and polymethyl methacrylate (PMMA) (right).

Polystyrene-comparison

Submicron infrared spectroscopy in seconds

The new innovative mirage infrared microscope system provides infrared spectroscopy and submicron infrared imaging in a wide range of applications. Using an exclusive technique based on O-PTIR spectroscopy, candling exceeds the diffraction limit of traditional infrared spectroscopy and bridges the gap between conventional infrared microspectroscopy and infrared spectroscopy at the nanometric scale.

Fast, easy-to-use contactless optical technology

mIRage overcomes the limit of IR diffraction with an innovative technique, photothermal infrared optical spectroscopy (O-PTIR).
A tunable pulsed medium infrared laser induces photothermal effects on the surface of a sample, measured using a visible probe laser focused on the sample. Measurements are collected quickly and easily, without the need for contact-based techniques such as ATR spectroscopy.

Eliminates the need for thin layers

FTIR transmission quality spectrum in reflection mode
mIRage provides infrared spectroscopy and chemical imaging, regardless of the infrared wavelength. Using O-PTIR, highly sensitive IR measurements are enabled, allowing absorption of transmission quality without contact with the surface. This eliminates the need for thin samples and improves turnaround times.

Mirage-product
O-ptir
Bonesample-hyperspectrlimaging

Bone sample: Reflection mode IR Spectra and hyperspectral imaging 25 x 25 µm array, 500-nm spacing. Left: Single wavelength image (1058 cm-1) from Hyperspectral data set. Right: Single-pixel spectrum – 1s collection time

ADVANTAGES

- Sub-µm spatial resolution whatever the wavelength
- Simultaneous IR and RAMAN spectroscopies
- Quick and easy to use non-contact optical technique
- Eliminates the need for thin layers

System specifications

IR Spectral range
Raman Spectral range 900-200 cm-1 (c)
IR mode ReflectionTransmission (d)
RAMAN mode Reflection
Probe laser(mIRage/Raman) 532 nm (e)
Stage minimum step size 100 nm
Stage x-y travel range 110x75 mm

Contact us for more information on this technique

Would you like an estimatation ?
Additional information?
We will reply to you within 24 hours

  • This field is hidden when viewing the form


NAVIGATION

- Surface analysis products

- Services

- Training

- After sales service

COMPANY

- ScienTec

- Contact

- News

FOLLOW US

Newsletter

- Newsletter

- Facebook

- Linkedin

Logo-sti-footer

00 34 91 842 94 67

info@scientec.es

© 2019 Scientec Ibérica. All Rights Reserved.