Optical profilometers
Optical profilometry brings together a set of contactless surface metrology technologies. Scientec offers a wide and varied offer in optical microscopy: interferometer, confocal, focus variation, digital holography… Obtain 3D surface topographies in high resolution, quickly and easily. Then use the results and display an in-depth analysis in a few clicks. Each optical technology is unique and complementary, Scientec will advise you on the best solution adapted to your metrological needs. Discover our solutions with the ranges of KLA, LyncéeTec, and Filmetrics.
D-Surface View is intended to help manufacturers of wafers up to 300mm in diameter reduce costs and for chipmakers to improve yields of devices manufactured with best-in-class process technology.
The equipment can be used for wafer surface quality control. It qualifies the roughness, shape, flatness and topography of the surface in a single measurement of a bare or treated insert.
The Profilm3D is a Filmetrics interferometer, efficient and at a very attractive price. Ultra compact, it incorporates by default a 10x10cm motorized stage, 500µm piezo scanning and objective detector. Perfect punctual measurement tool for Quality Control and R&D.
The Zeta-20 table optical profilometer is a non-contact 3D surface topography measurement system.
The system is powered by patented ZDot ™ technology and multi-mode optics, allowing measurement of a variety of samples: transparent and opaque, with low to high reflectance, of smooth to rough texture and with pitch heights ranging from nanometers to millimeters.
The Zeta-388 table optical profilometer is a non-contact 3D surface topography measurement system. The system is powered by patented ZDot ™ technology and multi-mode optics, allowing measurement of a variety of samples: transparent and opaque, with low to high reflectance, of smooth to rough texture and with pitch heights ranging from nanometers to millimeters.
The MicroXAM-800 optical profilometer is a non-contact 3D surface topography measurement system. The MicroXAM white light interferometer supports phase and vertical scanning interferometry to measure characteristics from nanometer to millimeter.
Digital holographic microscopy (DHM) offers solutions for static and dynamic 3D characterization in materials science and life science applications. The solutions combine DHM with dedicated hardware, software and specific options to meet the needs of innovative R & D for industrial applications. DHM technology and products have been developed by Lyncée Tec, which also has the skill and flexibility to offer customization and OEM systems.