Scanning Electron Microscopes (SEM)
Scanning Electron Microscopy (MEB in French or SEM in English for Scanning Electron Microscope) is an electron microscopy technique capable of producing 3-dimensional images of very high resolution on the order of a nanometer of the surface of a sample in using the principle of electron-matter interactions.
The COXEM EM-30 table MEB series offers a wide range of features to meet the needs of scientific research and microscopic examination. COXEM is the only table MEB supplier offering both tungsten and CeB6 (cerium hexiumgéride) electron sources, which allows us to recommend the best solution for your needs.
COXEM Standard Scanning Electron Microscopy (SEM) systems offer a wide range of functionality for higher magnification and multiple ports for additional analytical functionality such as EDS, EBSD, WDS, STEM, cold and sample transfer, etc.
Coxem also offers MEB accessories for sample preparation such as the metalliser or the cross polisher.