Spot measurement
F20
1. Simple configuration from 10,000 €
2. 10Å to 10mm
3. Quick measurement
4. Wide measuring range
The F20, F10 and F3 are general purpose film thickness measuring instruments and are used in thousands of applications worldwide. Thickness and refractive index can be measured in less than a second. Like all our thickness measuring instruments, the F20 connects to the USB port of your Windows® computer and is installed in a few minutes.
F20 series: Versatile solution perfectly suited to R&D and quality control.
- F10 series: Mainly dedicated to reflectance (spectrum) measurement. Possible evolution towards thin layer measurement.
- F3 series: Simple and compact design allowing on-site measurement.
Reflectometry
Applications
- Semiconductor films
- photoresist
- Film processing
- dielectrics
- photoresist
- Optical coating
- Hard coat thickness
- Anti-reflective coating
- Hard coat thickness
- Screens
- oled
- Glass thickness
- ITO & other TCOs
- oled
- biomedical
- parylene
- Medical equipement
- parylene
More info on applications
- Dielectric
- Hard thickness
- IC failure analysis
- ITO and other TCO
- Medical equipement
- Metal thickness
- Microfluidics
- OLED
- Ophthalmic coatings
- Parylene Coatings
- Photoresist
- Porous silicon
- Treatment films
- Refractive index & k
- Wafers and membranes of silicon
- Solar applications
- Semiconductor teaching laboratories
- Roughness and surface finish
Form 10Å to 10mm
What's included
- Flattening filter (for highly reflective substrates)
- Integrated spectrometer / light source
- FILMeasure 8 software
- FILMeasure standalone software for remote data analysis
- SS-3 sample board with fiber optic cable
- Reflectance standards
- Standard thickness
- Replacement lamp TH-1
Additional benefits
- Library with more than 130 materials included with each system, with access to 100 others
- Application engineers available for immediate 24 hour assistance (Monday to Friday)
- "Hands On" online support
- Hardware upgrade program
ADVANTAGES
- Simple configuration from 10,000 €
- 10Å to 10mm
- Quick measurement
- Wide measurement range
Accessories
SampleCam
StageBase-XY10-Auto-100mm
Multi-value thickness standard
NIST-traceable thickness standard
Contact probe
Carrying case
Specifications
Model Specifications
| Model | Thickness Range* | Wavelength Range |
|---|---|---|
| F20 | 15nm - 70µm | 380-1050nm |
| F20-EXR | 15nm - 250µm | 380-1700nm |
| F20-NIR | 100nm - 250µm | 950-1700nm |
| F20-UV | 1nm - 40µm | 190-1100nm |
| F20-UVX | 1nm - 250µm | 190-1700nm |
| F20-XT | 0.2µm - 450µm | 1440-1690nm |
| F3-sX Series | 10µm- 3mm | 960-1580nm |
*film stack dependent
Thickness Range*
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