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Vous êtes ici : Accueil > Produits > Automated Thickess Mapping for Production Environments

Automated thin-film thickness mapping

F60t main image-large

F60

1. Dedicated to production

2. Automated

3. Fast

4. Customizable

The F60-t family maps film thickness and index just like our F50 products, but it also includes a number of features intended specifically for production environments. These include automatic notch finding, automatic on-board baselining, an enclosed measurement stage with motion interlock, and an industrial computer with pre-installed software.

  • F50 Serie : Customizable thickness mapping - best cost/effective solution. More information >
  • F54 Serie: Fine spot size - sample up to 450mm in diameter - R&D.  More information >
  • F54-XY-200mm Serie: Acoustic protection cover - Production.  More information >

Reflectometry

F20

F20 :
Spot measurement >>

F40

F40 :
Adaptable to microscope >>

Inline-monitoring-f30

F30 :
Multi sites/ In-Situ >>

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Applications Features Accessories Specifications
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your sample

Applications 

  • SEMICONDUCTOR FABRICATION

    • Photorésist

    • Oxides

    • Nitride

    • Polysilicon

    LIQUID CRYSTAL DISPLAYS

    • Cell Gaps
    • Polyimide

    OPTICAL COATINGS

    • Hardness Coatings
    • Anti-Reflection Coating
    • Filters
Photoresist image
Process film image
Oled image
Medical devices image

More info on applications

- Amorphous and polysilicon
- Dielectric
- Hard thickness
- IC failure analysis
- ITO and other TCO
- Medical equipement
- Metal thickness
- Microfluidics
- OLED
- Ophthalmic coatings
- Parylene Coatings
- Photoresist
- Porous silicon
- Treatment films
- Refractive index & k
- Wafers and membranes of silicon
- Solar applications
- Semiconductor teaching laboratories
- Roughness and surface finish

Automated Thickess Mapping for Production Environments

Thin-film thickness and n & k are mapped quickly and easily with the F60 advanced spectral reflectance system. The motorized R-Theta stage moves automatically to selected measurement points and provides thickness measurements in seconds. Choose one of the dozens of predefined polar, rectangular,  or  linear map patterns, or create your own with no limit on the number    of measurement points. A typical 49-point map takes about 45 seconds.

Included are a number of features intended specifically for production environments, such as automatic notch finding, automatic on-board baselining, an enclosed measurement stage with motion interlock, and an industrial computer with pre-installed software.

Screenshot f60 med-large
Screenshot f60 map med-large

ADVANTAGES

- Dedicated to production

- Automated

- Fast

- Customizable

Accessories

Nist

NIST-traceable thickness standard

Chuck

F50 chuck - 100mm, 200mm, 300mm & 450mm

Specifications

Model Specifications 

Model Thickness Range* Wavelength Range
F60-t 20nm - 70µm 380-1050nm
F60-t-UV 5nm - 40µm 190-1100nm
F60-t-NIR 100nm - 250µm 950-1700nm
F60-t-EXR 20nm - 250µm 380-1700nm
F60-t-UVX 5nm - 250µm 190-1700nm
F60-t-XT 0.2µm - 450µm 1440-1690nm
F60-s980 4µm - 1mm 960-1000nm
F60-t-s1310 7µm - 2mm 1280-1340nm
F60-t-s1550 10µm - 3mm 1520-1580nm

*film stack dependent

Thickness Range*

F60 specs

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