Automated optical profilometer, large sample Zeta-388 1. For industry 2. Automated measurement 3. High resolution 3D topography in color even on transparent sample 4. Interferometric: white light VSI – Nomarski – PSI 5. Thickness of transparent thin layers The Zeta-388 offers metrology and 3D imaging capability, combined with an integrated isolation table and a cassette-to-cassette […]
Standards Calibration – Standard step Zeta-388 1. For industry 2. Automated measurement 3. High resolution 3D topography in color even on transparent sample 4. Interferometric: white light VSI – Nomarski – PSI 5. Thickness of transparent thin layers Optical profilometry Zeta-20 : Optical profilometer for R&D >> Profilm3D : Optical profilometer at the best quality […]
Optical profilometer for industry Zeta-388 1. For industry 2. Automated measurement 3. High resolution 3D topography in color even on transparent sample 4. Interferometric: white light VSI – Nomarski – PSI 5. Thickness of transparent thin layers The Zeta-388 offers metrology and 3D imaging capability, combined with an integrated isolation table and a cassette-to-cassette wafer […]
Profilometer for stress measurement Zeta-388 1. For industry 2. Automated measurement 3. High resolution 3D topography in color even on transparent sample 4. Interferometric: white light VSI – Nomarski – PSI 5. Thickness of transparent thin layers The Zeta-388 offers metrology and 3D imaging capability, combined with an integrated isolation table and a cassette-to-cassette wafer […]
DHM microscope – Materials science Zeta-388 1. For industry 2. Automated measurement 3. High resolution 3D topography in color even on transparent sample 4. Interferometric: white light VSI – Nomarski – PSI 5. Thickness of transparent thin layers The Zeta-388 offers metrology and 3D imaging capability, combined with an integrated isolation table and a cassette-to-cassette […]
DHM microscope – Life science Zeta-388 1. For industry 2. Automated measurement 3. High resolution 3D topography in color even on transparent sample 4. Interferometric: white light VSI – Nomarski – PSI 5. Thickness of transparent thin layers The Zeta-388 offers metrology and 3D imaging capability, combined with an integrated isolation table and a cassette-to-cassette […]
Table Top scanning electron microscopes EM-30 Serie 1. For industry 2. Automated measurement 3. High resolution 3D topography in color even on transparent sample 4. Interferometric: white light VSI – Nomarski – PSI 5. Thickness of transparent thin layers The Zeta-388 offers metrology and 3D imaging capability, combined with an integrated isolation table and a […]
Standard scanning electron microscopes EM-30 Serie 1. For industry 2. Automated measurement 3. High resolution 3D topography in color even on transparent sample 4. Interferometric: white light VSI – Nomarski – PSI 5. Thickness of transparent thin layers The Zeta-388 offers metrology and 3D imaging capability, combined with an integrated isolation table and a cassette-to-cassette […]
SEM sample metallizer EM-30 Serie 1. For industry 2. Automated measurement 3. High resolution 3D topography in color even on transparent sample 4. Interferometric: white light VSI – Nomarski – PSI 5. Thickness of transparent thin layers The Zeta-388 offers metrology and 3D imaging capability, combined with an integrated isolation table and a cassette-to-cassette wafer […]
SEM sample polisher EM-30 Serie 1. For industry 2. Automated measurement 3. High resolution 3D topography in color even on transparent sample 4. Interferometric: white light VSI – Nomarski – PSI 5. Thickness of transparent thin layers The Zeta-388 offers metrology and 3D imaging capability, combined with an integrated isolation table and a cassette-to-cassette wafer […]
EDS : Quantitative measurement of the elements Applications in optical profilometry Life sciences Microbiology Food / Environmental Sciences Plants and animals Medicine / Pharmaceutical Human body Materials science Chemistry Automobile Construction Smartphones Energy Semiconductors and electronics Metals automated analysis of characteristics / particle Automatic mapping and mapping EDS on large surfaces metal inclusion analysis (steel […]
Atomic Force Microscope best cost/effective solution Nano-Observer 1. Best cost effective solution 2. High resolution and measurement quality 3. Advanced electrical modes, multiple modes and environments 4. Ease of use (software, side and top views) The Nano-Observer is a compact and powerful AFM microscope with an all-in-one scanner (large and high resolution scans in a […]