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F20 - Thin film measurement

F20 - Thin film measurement


Thickness and optical constants (n and k) are measured quickly and easily with the F20 advanced spectrometry system. Spectral analysis of reflectance from the top and bottom of the thin film provides thickness, refractive index, and extinction coefficient in less than a second. The entire desktop system sets up in minutes and can be used by anyone with basic computer skills.
The F20 includes everything required for measurements: spectrometer, light source, fiber optic cable, sample stage, and Windows™ application software — just add your computer.

Standard 400-1000nm system accounts for more than half of sales. Other F20 models extend the thickness or wavelength capabilities of the F20, or they are application specific.

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