Document sans titre



F40 - Thin film measurement

F40 - Thin film measurement


This system is designed to measure thickness by using the light collection optic of a microscope. Due to the extreme angle of the cone of light, it is designed to measure thickness only, not index. Available in VIS, NIR, EXR, and XT configurations. Useful for patterned surfaces, small spot size requirements, and the medical device market.
The F20 includes everything required for measurements: spectrometer, light source, fiber optic cable, sample stage, and Windows™ application software — just add your computer.

Thickness is measured quickly and easily with Filmetrics advanced spectrometry systems. Spectral analysis of reflections from the top and bottom of the thin film provides thickness in seconds.

For measurements on patterned surfaces and other applications that require a spot size as small as 10 microns, just add the model F40 to your microscope. For common microscopes the F40 is a simple bolt-on attachment, complete with a c-mount for a CCD camera.

Applications :


Further information


Contact us


Full name : First name :
Company : Tel :
E-mail :    

Commentaries :